Broadcom Selects Teseda's Diagnostic Test System

PORTLAND, OR--(Marketwired - March 31, 2015) - Teseda Corporation today announced that Broadcom Corporation, a global innovation leader in semiconductor solutions for wired and wireless communications, has purchased the Teseda Diagnostic Test System for design debug, test pattern debug, scan debug and device validation.

Teseda's Diagnostic Test System is a core design analysis and product engineering tool used for first silicon bring-up and general product engineering that has provided Broadcom with a complete bench-top device stimulus and test system to achieve working silicon and enhanced semiconductor device performance.

"Teseda's Diagnostic Test System provides the reliability and proven performance we need to quickly test first silicon, conduct design debug and validate test patterns," said Mo Aslam, Principal Test Engineer at Broadcom Corporation. "The small form factor and low price point allows the system to be used anywhere, including a desk top environment, resulting in added flexibility for our global engineering team."

"We are delighted with Broadcom UK's decision to upgrade to our latest product, the Diagnostic Test System" said Armagan Akar, Chief Executive Officer at Teseda Corporation. "Teseda continues to provide scalable and upwardly compatible products meeting customers' evolving needs."

The Teseda Diagnostic Test System provides a desk top platform environment for Design-For-Test scan architecture validation. Establishing the structural integrity of a new device is essential for the design and scan debug in 1st silicon. The features in the system, to be used by DFT and Product engineers, further includes the capabilities for test pattern validation and debug for production test.

Broadcom purchased their first Teseda system in 2007 and are now trading in their original V520 system and upgrading to the Teseda Diagnostic Test System based on the success and value demonstrated over the past eight years. For more information about Teseda's Diagnostic Test System, please visit http://www.teseda.com/#!/products.

About Teseda Corporation
Teseda Corporation, based in Portland, Oregon, was founded in 2001. What makes Teseda's solutions so unique is the combination of bench-top test hardware with powerful software tools to produce systems that are capable of performing device analysis in ways that no other semiconductor equipment provider can, or does. From a portable, go anywhere system for Remote Customer Quality Engineers to quickly screen potential field returns, to a small and powerful Design and Product Engineering system for first silicon bring-up, to a fully equipped device analysis lab system for detailed physical root cause defect isolation, Teseda provides unique and critical technology for semiconductor device analysis. More information can be found at: www.teseda.com.

Image Available: http://www.marketwire.com/library/MwGo/2015/3/30/11G037040/Images/Diagnostic_Test_System_1-605833713483.jpg