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FormFactor Introduces Next-Generation 300-mm Full-Wafer Test Solution for DRAM
SmartMatrix(TM)100 Probe Solution Lowers Test Cost per Die for Leading-Edge Mobile and Commodity DRAM Test Applications and Extends the Life of the Tester Cell
| Source: FormFactor
LIVERMORE, CA--(Marketwire - December 1, 2009) - FormFactor, Inc. (NASDAQ : FORM ) today
introduced its next generation 300-mm full-wafer-contact probe card for
DRAM devices -- the SmartMatrix™ 100 probe solution. Incorporating a
new, proprietary probe card architecture that leverages FormFactor's
MicroSpring® MEMS contact technology, the SmartMatrix 100 was
specifically designed to support DRAM manufacturers' fast design ramps,
advanced product roadmaps and stringent cost-of-test requirements.
Designed for testing 5Xnm-node and below DDR2 and DDR3 mobile and commodity
DRAM devices, SmartMatrix 100 probe cards offer enhanced probing
performance that enables DRAM manufacturers to extend the life of their
existing test equipment and avoid the need for additional capital spending
within their test cells.
"As memory product lifecycles accelerate, DRAM manufacturers face shrinking
windows of opportunity to ramp up to profitability on their new designs and
are requiring key suppliers to provide unprecedented operational
responsiveness and flexibility to support test operations," stated Stefan
Zschiegner, senior vice president of FormFactor's DRAM product business.
"Our new SmartMatrix 100 solution delivers out-of-the box probe performance
that offers both technological and operational enhancements to enable DRAM
manufacturers to stay on their test roadmaps and lower their cost of test."
New Architecture Improves Manufacturing and Operational Efficiency
Like FormFactor's recently introduced TouchMatrix™ probe card for
advanced NAND Flash testing, the new SmartMatrix 100 probe card features an
innovative architecture that significantly improves manufacturing
efficiency and reduces probe card delivery lead time. These capabilities
are particularly important for DRAM manufacturers, who face rapid fab cycle
times as well as steep and dynamic ramp plans. SmartMatrix 100 probe cards
can also be easily disassembled for repair and reassembled for faster
turnaround time with minimal adjustment.
SmartMatrix 100 probe cards are also designed for improved thermal
performance, which allow the cards to quickly reach test temperatures.
This improved thermal performance enables dual-temperature operation and
ensures thermal stability during wafer and lot changes, making the new
platform extremely robust in demanding performance environments. With this
capability, the new probe card offers scrub consistency even on smaller
pads and pad pitches, and can compensate for a lack of prober- or test-head
stability, for increased probing uptime. The new design virtually
eliminates thermal bow effects of traditional full-wafer-contact probe
cards -- providing improved contact precision and more consistent scrub
marks across the full temperature range. FormFactor's RapidSoak™
technology is also available as an option, which enables SmartMatrix 100
probe cards to further reduce soak time.
Scalable MEMS Probes Optimize Yield and Support Future Test Roadmaps
Leveraging FormFactor's MicroSpring MEMS contacts, SmartMatrix 100 probe
cards offer superior scrub performance with proven x/y contact
reproducibility and long life. The MicroSpring technology also provides
superior power delivery, low noise, and stable contact resistance, which
ensures accurate test yields. The SmartMatrix probe cards have a
MicroSpring roadmap to enable pad pitches as small as 50 microns and pad
sizes as small as 40x50 microns -- supporting DRAM manufacturers' migration
to 5X-nm and 4X-nm design rules.
Proprietary Advanced TRE™ Technology Increases Test Parallelism
SmartMatrix 100 is also compatible with FormFactor's advanced TRE™
technology, which enables more efficient use of tester channels on test
equipment to increase the total number of devices that can be tested
simultaneously by a factor of four or higher. This TRE technology
currently allows the testing of as many as 512 devices on each touchdown.
Using the SmartMatrix probe card, DRAM manufacturers and test service
providers can significantly increase test cell throughput on new test
equipment, extend the life of their existing test equipment, and reduce
their overall cost of test.
FormFactor's SmartMatrix 100 probe cards are now in qualification testing
and are available for shipping.
Forward-Looking Statements
Statements in this press release that are not strictly historical in nature
are forward-looking statements within the meaning of the federal securities
laws, including statements regarding our products and solutions, demand for
our products and future growth. These forward-looking statements are based
on current information and expectations that are inherently subject to
change and involve a number of risks and uncertainties. Actual events or
results might differ materially from those in any forward-looking statement
due to various factors, including, but not limited to: the Company's
ability to support DRAM manufacturers' fast design ramps, advanced product
roadmaps and stringent cost-of-test requirements; the Company's ability to
manufacture and sell SmartMatrix probe cards that deliver enhanced probing
performance to enable DRAM manufacturers to extend the life of their
existing test equipment and avoid the need for additional capital spending
within their test cells, that can significantly increase test cell
throughput, and that provide improved thermal performance to enable
dual-temperature operation and ensure thermal stability during wafer and
lot changes; the Company's ability to scale the SmartMatrix probe card to
offer scrub consistency even on smaller pads and pad pitches to support
DRAM manufacturers' test roadmaps and migration to 5X-nm and 4X-nm design
rules; the capability of the SmartMatrix probe card to compensate for a
lack of prober- or test-head stability and to virtually eliminate thermal
bow effects. Additional information concerning factors that could cause
actual events or results to differ materially from those in any
forward-looking statement is contained in the company's Form 10-K for the
fiscal year ended December 27, 2008 and Form 10-Q for the fiscal quarter
ended September 26, 2009 as filed with the Securities and Exchange
Commission ("SEC"), and subsequent SEC filings. Copies of the company's SEC
filings are available at http://investors.formfactor.com/edgar.cfm. The
company assumes no obligation to update the information in this press
release, to revise any forward-looking statements or to update the reasons
actual results could differ materially from those anticipated in
forward-looking statements.
About FormFactor
Founded in 1993, FormFactor, Inc. (NASDAQ : FORM ) is the leader in advanced
wafer probe cards, which are used by semiconductor manufacturers to
electrically test ICs. The company's wafer sort, burn-in and device
performance testing products move IC testing upstream from post-packaging
to the wafer level, enabling semiconductor manufacturers to lower their
overall production costs, improve yields, and bring next-generation devices
to market. FormFactor is headquartered in Livermore, California with
operations in Europe, Asia and North America. For more information, visit
the company's web site at www.formfactor.com.
FormFactor, SmartMatrix, MicroSpring, RapidSoak and TRE are trademarks or
registered trademarks of FormFactor, Inc.