SOURCE: PXI Systems Alliance (PXISA)

November 05, 2007 04:00 ET

PXISA Demonstrates New Multivendor Test Systems at Productronica 2007

Nine PXI Vendors Jointly Develop PXI Application Demos for Communications Test, High Channel Count Measurements, and Mixed Signal Test

NIWOT, CO--(Marketwire - November 5, 2007) - The PXI Systems Alliance (www.pxisa.org) today announced their participation at Productronica 2007, the world's leading tradeshow for electronics production, to be held in Munich, Germany at the New Munich Trade Fair Centre on Nov. 13-16. The PXISA booth will be located in Exposition Hall A-1, Booth 535. PXISA representatives from Acculogic, ADLINK, Aeroflex, Agilent Technologies, Alfautomazione, Chroma ATE, GaGe, Geotest, Göpel electronic, JTAG Technologies, Keithley Instruments, KineticSystems, Konrad Technologies, MAC Panel, Meilhaus Electronic, National Instruments, Pickering Interfaces, PXIdirect, Rohde & Schwarz, and Teradyne will be available during exhibit hours to discuss PXI and PXI Express specifications, potential applications, and future growth opportunities.

"Our demonstrations at Productronica are indicative of the PXI Systems Alliance's focus on interoperability by our vendors to solve virtually any test & measurement application," said Loofie Gutterman, president of the PXI Systems Alliance. "As part of our celebration of the 10th anniversary of the PXI specification, we wanted to showcase the capabilities of the PXI platform to the industry at Productronica 2007."

Three new PXISA multivendor system demonstrations will be on display in the PXISA booth at Productronica 2007 for attendees to see how PXI solves many of today's most challenging test applications including communications test, high channel count measurements, and mixed signal semiconductor test.

The fully integrated demo systems highlight the flexibility of the PXI standard to build complete test systems using PXI modules from multiple vendors. The three demos were built in a collaborative effort by nine PXI vendors and feature the following capabilities:

Zigbee Wireless Transceiver Test System

This system demonstrates the integration of PXI modules from multiple vendors to perform JTAG boundary scan and radio frequency (RF) tests. Specifically, the PXI demo system performs various ZigBee protocol performance tests such as RF signal strength, error vector magnitude (EVM), and power spectral density tests in addition to JTAG structural tests on the Zigbee transceiver components. The demo features PXI products from National Instruments, Keithley, Göpel electronic, Pickering Interfaces, and MAC Panel.

864-channel Simulated Jet Engine Data Acquisition System

This demo features 864 channels of data acquisition in a single PXI/cPCI chassis with hardware and software from multiple vendors including GaGe, KineticSystems, Geotest, Keithley Instruments, ADLINK, and National Instruments. Measurements acquired from the jet-engine simulation include temperature, pressure, flow, RPM, and ARINC-429. Both 3U and 6U PXI/cPCI modules are used in the system and functionalities include digital I/O, analog-to-digital and digital-to-analog converters, signal conditioning, digitizers, frequency counters, and multifunction data acquisition.

Mixed Signal Semiconductor Test System

This demo highlights the interoperability, compact footprint, and performance of the PXI platform for both digital and analog test applications. The demonstration employs a two-channel, 12-bit, 125 MS/a digital to analog device as a device under test (DUT) and includes a complement of AC parametric tests such as differential non-linearity, integral non-linearity, channel skew, rise and fall times, total harmonic distortion, signal to noise, and spurious free dynamic range. The resulting test program demonstrates how users can successfully integrate high performance, mixed-signal test systems using off the shelf instruments and software technologies available from PXI vendors. The demo features PXI products from GaGe, Geotest, Keithley, MAC Panel, Pickering and ZTEC.

Productronica 2007 attendees are encouraged to visit the PXISA booth in Hall A-1, Booth 535 to view the above multivendor automated test systems and to learn more about the advantages of PXI-based test and measurements systems, such as unmatched system performance, integrated timing and synchronization, and compact system footprint.

About the PXI Systems Alliance

Formed in June 1998, the PXISA is a group of more than 56 companies that share a common commitment to end-user success with open, multivendor CompactPCI systems for applications in test and measurement, industrial automation and data acquisition. The primary goal of the PXISA is to improve the effectiveness of CompactPCI-based solutions in measurement and automation through the use of the PXI specification. PXISA membership is open to vendors who share the PXI philosophy and objectives, and have a desire to produce and promote products and solutions compatible with alliance goals. For more information, visit www.pxisa.org.

Product and company names listed are trademarks or trade names of their respective companies.

Contact Information

  • For more information about the PXI Systems Alliance, please contact:

    Bob Helsel
    Executive Director
    PXI Systems Alliance
    Phone: (303) 652-2585
    Fax: (303) 652-1444
    Email Contact
    www.pxisa.org