TOKYO, JAPAN--(Marketwired - May 27, 2014) - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has released its new EVA100 measurement system, an evolutionary value-added platform that combines digital and analog testing capabilities to handle small-pin-count analog, mixed-signal and sensor semiconductors.
The EVA100's expandable architecture provides the flexibility to conduct a wide range of measurement functions. Operation is highly intuitive, alleviating the need for users to have advanced programming skills and helping customers to get their latest ICs to market faster.
Designed for use in both engineering and volume-production environments, the EVA100 allows simultaneous control of multiple test functions to achieve highly precise measurements and improve testing efficiency. By integrating analog-voltage and current-source measurements, an eight-channel, 100-Mbps pattern generator and an oscilloscope in one compact, lightweight system, the EVA100 also eliminates the need for complicated cabling to connect and coordinate the various instruments.
"Analog and mixed-signal ICs are critically important in enabling the increasing performance, higher accuracy and longer reliability of today's smart electronics," said Satoru Nagumo, executive officer of Advantest Corporation. "Our new monolithic test solution eliminates the high cost, complex set up and long lead times required when using several kinds of measurement instruments to test these devices."
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.