Anritsu Corporation

Anritsu Corporation

September 28, 2005 01:48 ET

Anritsu Announces MP1590B Network Performance Tester; One-Box Tester Supporting Next Generation Converged Networks

ATSUGI-CITY, JAPAN--(CCNMatthews - Sept. 28, 2005) - Anritsu Corporation (TOKYO:6754):

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With the accelerating convergence of IP networks and optical/digital transmission, EoS technology for sending LAN-based Ethernet over WAN-based SONET/SDH is widely hailed as one of the most important next generation network technologies. To respond to the needs created by this new technology, Anritsu has enhanced the VCAT and LCAS options on its MP1590B EoS unit.

In the 10 Gbit/s transceiver module market, it is expected that XFP modules will become mainstream from now on because they are smaller and have lower power consumption. In response, Anritsu has developed the first 10G Electrical Differential Interface Units to make precise XFP module jitter measurements that were previously impossible using conventional measuring methods.

Product Overview

EoS Measurements

The new EoS units are compatible with GFP, LEX, LAPS (X.86), PPP, and other encapsulation methods. Detailed EoS frame data can be checked in real time using over 120 real-time counters as well as Ethernet frame and GFP frame capture and decode functions. Development of VCAT and LCAS options compliant with ITU-T standards has made it possible to measure a broad variety of EoS transmission circuits. Finally, a VCDD option enabling evaluation of a device's ability to absorb the full range of allowable differential delay variations has been developed. As a result, a single MP1590B Network Performance Tester can perform efficient evaluation of EoS-compatible networks, transmission devices, and modules based on ITU-T standards.

Measuring XFP Jitter Using an Electrical Differential Interface

An XFP module has an optical interface on the transmission-circuit side and an electric differential interface called XFI on the equipment side. Both interfaces must be used when assessing characteristics of the module. However, because no measuring instruments conforming to XFI had been available until now, precise measurement of jitter that was degrading circuit performance was impossible because noise generated inside the XFP module or improper matching conditions with the instruments influenced the measurements.

Using the newly developed Electrical Differential Interface Unit makes it possible to perform all the basic jitter measurements (jitter resistance, jitter transmission, and jitter generation) independently for transmission and reception, so precise jitter measurement of XFP modules can now be accomplished.

For further verification, an MP1590B optical interface can be installed simultaneously, optical and digital signals can be output simultaneously, and both the electrical output level and electrical input level judgment threshold values can be changed.

About Anritsu

Anritsu Corporation (www.anritsu.com) is a global provider of innovative communications solutions for more than 110 years. With offices throughout the world, Anritsu with the recent acquisition of NetTest (www.nettest.com) provides solutions for existing and next-generation wired and wireless communication systems and operators. The company's measurement solutions include wireless, optical, microwave/RF, and digital instruments, operations support systems and solutions that can be used during R&D, manufacturing, installation, and maintenance. Anritsu also provides precision microwave/RF components, optical devices, and high-speed devices for design into communication products and systems. The recently combined companies sell in over 90 countries worldwide and have approximately 4,000 employees.

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