SOURCE: Cascade Microtech
BEAVERTON, OR--(Marketwired - Apr 11, 2014) - Cascade Microtech, Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of integrated circuits at the wafer level, announces the final Call for Papers for its second users' conference, COMPASS 2014. The conference will provide Cascade Microtech users with best practices, tools and techniques to increase productivity across wafer probing applications. The conference will address important issues in various use cases to include device characterization and modeling, reliability, and manufacturing test. The full-day conference begins with a welcome reception on October 9, 2014 leading into a full day of workshops and presentations on October 10th at the Hilton Rome Airport in Rome, Italy
"COMPASS is a part of Cascade Microtech's new 'CONNECT' initiative, which we are developing in conjunction with our customers and partners who share a desire to stay ahead of technology," said Debbora Ahlgren, Vice President of Marketing. "We believe the accumulated knowledge of our industry peers drives discovery and innovation, and that we can facilitate that exchange with our customers."
COMPASS will give users the opportunity to share ideas and solutions with fellow attendees who utilize a wide spectrum of process technologies. Topics will focus on industry-wide challenges and emerging technology requirements. Attendees will learn about the newest probe solutions for device characterization and modeling, as well as solutions for enabling high-volume test, while networking with technical experts from Cascade Microtech as well as the company's customers and partners.
Abstracts are being accepted through the end of April for 25-minute presentations for technology tracks covering a wide variety of both engineering and production topics including, but not limited to:
- RF/mmW measurement and calibration methodology
- High-voltage/high-current on-wafer device characterization
- Sub-THz measurements up to 500 GHz and beyond
- 3D TSV RF characterization
- Probe card metrology tools
- 40+ GHz test including automotive radar, cell phone short haul/backhaul, 802.11ad
To see the full list of suggested topic areas, and view the formal Call for Papers, visit compass.cascademicrotech.com. To respond to the Call for Papers, send an email with your name, presentation title, and a 200-word abstract to firstname.lastname@example.org.
About Cascade Microtech, Inc.
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech's leading-edge stations, probes, probe cards and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit www.cascademicrotech.com.