SOURCE: Credence Systems Corporation

March 18, 2008 11:18 ET

Credence Helps Customers Optimize Test Coverage, Throughput and Costs With Enhanced High Density Instrument for the Diamond Series

SHANGHAI, CHINA--(Marketwire - March 18, 2008) - SEMICON CHINA -- Marking a significant enhancement to the company's Diamond test platform, Credence Systems (NASDAQ: CMOS) today introduced the DD1096-32 digital instrument with 32M of reconfigurable parallel vector memory to solve test challenges facing consumer applications requiring deeper pattern memory. Using the 96-channel DD1096-32 within the 10-slot Diamond 10 offers customers up to 768 channels, each with 32M of parallel vector memory depth. The DD1096-32 also enables up to 256 scan chains and over 77G of scan vectors. For massive multisite use in high-mix, high-volume production applications the 40-slot Diamond 40 with DD1096-32 scales up to 3072 channels with up to 1024 scan chains and over 309G scan vectors. This scan capability is configurable from narrow to wide "broadside" scan for ultra-efficient test coverage.

The DD1096-32 instrument's larger memories also provide enhanced test and debug capability with full memory depth deep fail and data capture which allows customers to quickly and confidently test complex, highly integrated devices in a single pass. At less than US$600/pin, the fully featured digital instrument offers the industry's best combination of performance and density in an air-cooled test system the size of a large desktop computer. The Diamond platform is an ideal choice for cost sensitive applications and lowers the total cost of ownership -- including capital acquisition, operational and facilities cost -- to optimize gross margins in the ultra competitive consumer marketplace.

"As we reach our goal to become the value standard for ATE in the consumer industry, we work hard on delivering all of the key components that constitute true value. Translating the benefits of this value to our customers means not only delivering optimal cost of ownership and ease of use, but also the best technology and business fit for a given market environment," stated Amir Aghdaei, Senior Vice President of Field Operations and Marketing at Credence. "These considerations are clearly important for our customers in the highly competitive consumer electronics arena, and become especially critical as increasingly integrated, multifunctional end products drive up gate and pin counts in new devices. The DD1096-32 instrument makes our Diamond test platform even more versatile, allowing our customers to realize the advantages of faster time-to-market in a very cost-effective and productive manner."

According to Gartner Dataquest, by 2010, digital video recorders, MP3 players, and digital TV processors using 65nm technologies will integrate all functions on a single chip. Multiple-pass testing becomes a real issue, because as manufacturers add more features on chip to differentiate their products, device size and complexity increases. But as market windows shrink, customers need more scan depth and width for broad test coverage, as well as deeper fail and data capture for debug efficiency. This means test engineers looking to test these higher pin- and gate-count devices using high throughput, single-pass test strategies need immediate access to more memory resources.

DD1096-32: More Cost-Performance Benefits for the Diamond Platform

The new DD1096-32 instrument provides many added advantages, complementing the broad instrumentation portfolio already available for the Diamond 10 and Diamond 40 test systems. Each of the 96 digital channels offers parametric measurement units, independent timing, formats and levels which enable flexible edge placement and digital signal creation for complex tests. Its 100MHz pattern sequencer can provide 200MHz clocks and drive data rates up to 200Mbps. The DD1096-32 comes with a flexible instruction set to support conventional functional tests, along with easy STIL-based EDA integration for structural test methods. It can handle any combination of input or output chains, useful for built-in self test (BIST) enabled devices. Moreover, two bits per scan output cycle allows masking of failing scan cells to improve customers' debug productivity, thus speeding time-to-market cycles. Other advanced features include algorithmic pattern generation for development and debug of embedded memory tests, field upgradeable firmware, integrated time measurement capability, high speed scalable data transport, flexible point-to-point triggering and pattern-speed synchronization with other instruments in the system.

The DD1096-32 instrument on the Diamond platform, along with the production-proven ASL test systems, will be on display during Semicon China, March 18-20, 2008 at the Credence-Spirox Booth No. 2415, Hall W2.

About Credence

Credence Systems Corporation (NASDAQ: CMOS) is a global provider of automated test equipment (ATE) solutions to the high growth, consumer semiconductor industry. Credence is committed to deliver the highest standards of value -- an optimal combination of technology, turn-around time, reliability, ease of use, service and support -- to every customer, which enables important cost and performance advantages for integrated device manufacturers (IDMs), wafer foundries, outsource assembly and test (OSAT) suppliers and fabless chip companies worldwide. An ISO 9001-certified company with a presence in 20 countries, Credence is headquartered in Milpitas, California. More information is available at http://www.credence.com.

Credence is a registered trademark and Credence Systems, is a trademark of Credence Systems Corporation. Other trademarks that may be mentioned in this release are the intellectual property of their respective owners.

Contact Information

  • Media Relations Contact:
    Brenda Ropoulos
    Communications Director
    Phone: 408-635-4309
    FAX: 408-635-4986
    E-mail: Email Contact