Eurocontrol Technics Group Inc.
TSX VENTURE : EUO

Eurocontrol Technics Group Inc.

July 06, 2016 07:30 ET

Eurocontrol's XwinSys Publishes a New Article in Solid State Magazine

Unique In-line and non-destructive hybrid technology - a new standard for the semiconductor industry

TORONTO, ONTARIO--(Marketwired - July 6, 2016) - Eurocontrol Technics Group Inc. (TSX VENTURE:EUO) ("Eurocontrol" or the "Company"), a Canadian public company specializing in the acquisition, development and commercialization of innovative authentication, verification and certification technologies, is pleased to announce that its subsidiary, XwinSys Technology Development Ltd. ("XwinSys"), is publishing an article describing its novel in-line and non-destructive hybrid metrology system, uniquely integrating advanced X-ray and optical technologies, designed to meet the current and future metrological challenges of the semiconductor industry.

The abstract will be published in the July 2016 edition of Solid State Technology, associated with SEMICON West 2016 exhibition, also available at www.electroiq.com.

XwinSys's unique and patented multi-mode technology system meets both fast in-line and in-depth metrology challenges, without interrupting the process flow.

Doron Reinis, Chief Operating Officer stated, "This is a case where the whole is greater than the sum of its parts - the integrated sensors create an innovative wholistic approach to problem solving and product monitoring - a disruptive technology that replaces the need for off-line analytical tasks."

Bruce Rowlands, Chairman and Chief Executive Officer, added, "XwinSys is ideally positioned to supply a revolutionary solution to a critical need in the newly emerging field of 3D interconnects in 3D integrated circuit stacks."

XwinSys will be presenting the hybrid technology and its portfolio of solutions at SEMICON West 2016, the world's marketplace for microelectronics innovation and largest conference and exhibition for the semiconductor industry. The Conference and Exhibition is being held at the Moscone Center, San Francisco from July 12th through July 14th, 2016. XwinSys will be exhibiting in the South Hall, booth # 2245.

About XwinSys Technology Development Ltd.

XwinSys was founded at 2012 and is a wholly owned subsidiary of Eurocontrol. The company is located in the hi-tech industrial park at Migdal Haemek in Israel. XwinSys is led by an outstanding team of senior managers, board members and global advisers with vast accumulated experience in high technology industries and is dedicated to the design, manufacture and marketing of novel solutions based on improved x-ray technology combined with automated optical 2D and 3D microscopes, for the semiconductor and related industries.

The XwinSys technology was designed to offer an innovative cost effective technological solution to the rapid-growing semiconductor industry. It offers a new approach that meets the challenge of roadmap requirements for inspection and metrology of 3D structures in the semiconductor industry. 3D-IC is the fastest growing segment of the semiconductor industry and leads the way to vertical stacking that is evolving as the disruptive force of the industry. For more information on XwinSys, visit www.xwinsys.com.

About Eurocontrol Technics Group Inc.

Eurocontrol is a TSX Venture listed company that specializes in the acquisition, development and commercialization of innovative authentication, verification and certification technologies. Eurocontrol has two wholly owned subsidiaries, Xenemetrix Ltd. and XwinSys Technology Development Ltd. Xenemetrix is a leading designer, manufacturer and marketer of ED-XRF systems, a technology that is the most accurate and economic method for determining the chemical composition of many types of materials, including the analysis of petroleum oils and fuel. Xenemetrix has an exclusive long-term supply, maintenance and support agreement with SICPA/GFI to supply SICPA/GFI with Xenemetrix products and services related to the oil and gas marking and monitoring field. XwinSys is in the final stage of developing a fully automated metrology system for the semiconductor industry that combines 2D and 3D image processing technology with Xenemetrix's ED-XRF technology.

Neither TSX Venture Exchange nor its Regulation Services Provider (as that term is defined in the policies of the TSX Venture Exchange) accepts responsibility for the adequacy or accuracy of this release. No stock exchange, securities commission or other regulatory authority has approved or disapproved the information contained herein.

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