SOURCE: Galaxy Semiconductor Solutions

Galaxy Semiconductor Solutions

March 17, 2015 08:00 ET

Galaxy Tool Suite for Enhanced Quality and Yield Management Selected by Major Semiconductor Company

Skyworks Solutions to Apply Galaxy Part Average Testing and Yield Management to a Broad Range of Devices

WALTHAM, MA--(Marketwired - Mar 17, 2015) - Galaxy Semiconductor Solutions, a provider of IC test data analysis and quality improvement software, today announced that it has entered into a licensing agreement with Skyworks Solutions, Inc for Galaxy's entire product suite including PAT-Man™, Yield-Man™ and Examinator™ software.

Galaxy's PAT-Man™ solution will serve as a key component of Skyworks' zero-defect program in manufacturing, aimed primarily at high reliability wireless and automotive applications. PAT-Man™ enables Skyworks to broaden the deployment of a Part Average Testing (PAT) process across its entire wafer probe and final test operations. PAT is the process of "outlier" detection and removal whereby parts that are within specification but outside of the normal distribution of test results are culled from production shipments. The Automotive Electronics Council (AEC) has promoted PAT over the past several years based on industry data that has shown that outliers have significantly higher failure rates over time.

"We are very pleased to add Skyworks to the growing list of industry leaders who have selected PAT-Man™ as part of their reliability initiatives for a broad range of devices," said Bertrand Renaud, COO of Galaxy Semiconductor. "PAT isn't just for the automotive market anymore, and PAT-Man™ is the natural choice for companies like Skyworks that are committed to zero defects for high volume, high reliability IC applications."

Galaxy's PAT-Man™, coupled with its Yield-Man™ database and Examinator viewer, represent a comprehensive software solution for Parts Average Testing (PAT) and related DPM reduction techniques, and manages the entire PAT process from initial wafer lot characterization to final-test yield monitoring. PAT-Man™ employs an intelligent outlier removal process, which helps improve device quality while minimizing unnecessary yield loss. PAT-Man™ is also tightly integrated with Galaxy Yield-Man, a scalable, enterprise yield management solution that helps optimize manufacturing and test processes.

About Galaxy

Galaxy Semiconductor Solutions is the de facto standard for test data analysis, yield management and quality enhancement software for the semiconductor industry. Our tools provide engineers and managers with "semiconductor intelligence" by mining the big data generated by semiconductor manufacturing and enabling better decision making and process improvement. Galaxy has a proven track record for building products that offer the best user experience and for premier customer support. As a result, our solutions are used worldwide by 5000+ users and the top 3 ATE companies. More information about Galaxy can be found at www.galaxysemi.com.

Editors note. PAT-Man™, Yield-Man™ and Examinator™ are trademarks of Galaxy Semiconductor

Contact Information

  • CONTACT:
    Galaxy Semiconductor
    Bertrand Renaud
    BertrandRenaud [~at~] galaxysemi.com
    Tel: (781) 891-1148
    Visit: http://www.galaxysemi.com