SOURCE: DCG Systems

DCG Systems

April 22, 2014 16:30 ET

IC Manufacturer Purchases Three nProber II™ Systems for Sub-14nm Electrical Fault Characterization

FREMONT, CA--(Marketwired - Apr 22, 2014) - Today DCG Systems, Inc. announced the purchase of three nProber II nanoprobing systems by a major IC manufacturer developing technology beyond the 14nm node. The nProber II system was selected for its ability to isolate electrical faults to the sub-transistor level and characterize the electrical properties of individual transistors and interconnects. With demonstrated improvement in probe and platform stability, throughput and automation over the widely adopted, previous-generation nProber system, the nProber II addresses the escalating process challenges brought by shrinking critical dimensions, three-dimensional transistor structures and increasing pattern density.

"To navigate their product roadmaps, our customers are turning to creative geometries and materials -- and as a result are encountering a new generation of electrical faults at final test that are often missed by traditional inline process control systems," said Israel Niv, Ph.D., Chief Executive Officer of DCG Systems. "After functional test methods identify a failure at the macro level, the nProber II system is employed to isolate and characterize the underlying electrical fault. The nProber II enables the engineer to drive to the root cause of a process issue efficiently."

"Having the nProber II system named tool of choice by an industry leader speaks to its value," added Mike Berkmyre, General Manager of the nanoInstruments Division at DCG Systems. "After a multi-year development effort, our engineers have achieved advances in the nProber II technology that enable thorough characterization of planar or 3D transistors and interconnects with significantly improved ease-of-use and speed. The nProber II is proving critical to next-generation chip development."

The nProber II nanoprobing system is a key product in DCG's portfolio of systems designed to accelerate technology development and yield ramp for semiconductor and electronics manufacturers. For more information on the nProber II nanoprobing system, please visit the nProber II product web page.

About DCG Systems
DCG Systems, Inc. is the industry's leading supplier of electrical fault characterization, localization and editing equipment, serving process development, yield ramp and failure analysis applications for a wide range of semiconductor and electronics manufacturers. With more than 1500 systems deployed worldwide, DCG Systems serves customers worldwide from its headquarters in Fremont, California and field offices in the United States, Japan, Taiwan, Korea, Malaysia, Singapore, Israel and Germany. For more information about DCG Systems, visit www.dcgsystems.com.

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