neks Technologies Inc.

neks Technologies Inc.

May 02, 2007 15:03 ET

Neks Web Seminar Features Leading Pediatric Dentist Dr. Lawrence Kotlow

Dr. Lawrence Kotlow to demonstrate benefits of the D-Carie mini caries detection device in primary teeth of children

MONTREAL, QUEBEC--(CCNMatthews - May 2, 2007) - Neks Technologies Inc, a company specializing in developing and manufacturing innovative dental products, today announced that Dr. Lawrence Kotlow, a leading pediatric dentist, is presenting a Web Seminar entitled: "Child-Friendly Caries Detection" demonstrating the effectiveness of the D-Carie™ mini caries detection device on children. Registrants can learn how dentists like Dr. Kotlow are using the D-Carie mini as an aid in the diagnosis of occlusal and interproximal caries. Dr. Kotlow will describe the results of actual patient studies involving the detection of caries in primary teeth of young children using the D-Carie mini that would have otherwise been undetected. The Web Seminar is available for viewing on the Neks Web site at: http://www.neks.ca/web_seminars_en.htm?pr.

Lawrence A. Kotlow, D.D.S., a graduate of SUNY Buffalo, New York Dental School has been in practice since 1974 and specializes in Pediatric Dentistry in his private dental practice located in Albany, New York. "As a pediatric dentist, I now have an additional tool for diagnosing interproximal as well as occlusal decay in very young children who cannot cooperate adequately to have intraoral diagnostic X-rays taken," said Dr. Kotlow. "I have found that the D-Carie unit has diagnosed many lesions on primary teeth that would have otherwise gone undetected in children, where radiographs were not possible. This has resulted in my office taking bitewing radiographs in instances where we may not have originally seen the need to do so and where very little clinical evidence of a developing lesion was observed. Children accept the probe with little concern and parents are excited to have an alternative to X-rays."

The D-Carie mini - quick, easy, accurate caries detection

The D-Carie mini is a lightweight, easy-to-use, cordless device that can be used as an aid for clinicians to quickly locate and diagnose caries. The D-Carie mini uses Light Emitting Diode (LED) and fiber optic technologies and is FDA approved as a diagnostic aid for the detection of both interproximal and occlusal caries. The device requires no calibration and is easy to sterilize. The D-Carie mini detects more than 92 percent of occlusal caries(1) and up to 85 percent of interproximal caries. Using only X-rays and dental explorers, dentists can overlook approximately half of incipient caries(2). When used as a diagnostic aid in conjunction with an X-ray, the D-Carie mini allows dentists to assess a third dimension - the volume of caries - prior to opening the tooth. The device also provides dentists with an option for examining and diagnosing children, pregnant women and patients who prefer to forgo X-rays or limit their exposure to them for health or personal reasons.

The device is useful for infants and young children, especially those with special needs who are unable to undergo radiographs. The tool is also effective in detecting caries and decalcification in the teeth of children with orthodontics. Additionally, it is an extremely effective communication tool enabling parents to better understand that treatment is necessary, and that there is an alternative when X-rays are not desired.

To attend the Neks Web Seminar

To participate in the online archived Web seminar with Dr. Kotlow please log on to http://www.neks.ca/web_seminars_en.htm?pr to register. Registrants will then receive direct access to the presentation link.

D-Carie mini Pricing and Availability

The D-Carie mini is available at a special offer of $2,999 U.S. (regular price of $3299 U.S.), and comes with an extra free probe. Offer valid until May 28th, 2007. Orders can be placed through Patterson Dental at 1-800-873-7683.

About Dr. Lawrence Kotlow

Lawrence A. Kotlow, D.D.S. has a private dental practice located in Albany, New York, USA. He is a graduate of SUNY Buffalo, New York Dental School and completed his Pediatric training at Children's Hospital, Cincinnati, Ohio. Dr. Kotlow has been in practice since 1974 and specializes in Pediatric Dentistry. He is board certified in Pediatric Dentistry by the American Board of Pediatric Dentistry. Dr. Kotlow received his advanced proficiency certification from the Academy of Laser Dentistry in the Erbium Laser and has Standard proficiency using the Diode laser. He is a past member of the executive board of the Academy of Laser Dentistry. Additionally, he has lectured and provided clinical instruction through out the United States, Canada and Australia about pediatric dentistry, lasers, microscopes, digital radiography and other high-tech advances in the practice of pediatric dentistry.

About Neks Technologies Inc.

Founded in Montreal, Quebec in 1999, Neks Technologies Inc. is a fast-growing Canadian company that specializes in the design, development, production, and commercialization of innovative and practical dentistry products and systems. Neks' D-Carie (http://www.neks.ca/mini_en.htm) and DetecTar (http://www.neks.ca/mini_detectar_en.htm) products are based on their unique LED and fiber optic technology platform that aids clinicians in the detection and diagnosis of lesions, calculus and caries. Neks' goal is to provide technological innovations that simplify procedures and tasks to increase dental professionals' productivity and improve the quality of patient care. For more information, please call 1-866-877-6357 or visit www.neks.com. For images of the D-Carie mini, please follow this link: http://www.neks.ca/news_en.htm.

(1) In Vitro and in-vivo comparative studies (http://www.neks.ca/forms/form.htm) of two caries diagnostic devices: DIAGNOdent® and D-Carie®, Hugo Ciaburro, D.M.D., M. Sc., F.R.C.D. University of Montreal, 2004.

(2) Clinical and radiographic diagnosis of occlusal caries: a study in vitro by Ricketts DN, Kidd EA, Smith BG, Wilson RF., J Oral Rehabil. 1995 Jan;22(1):15-20.

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