REMINDER: Media Alert: OneSpin Solutions, IMEC to Host Hands-On Tutorial on Metric-Driven Formal Verification

MUNICH, GERMANY--(Marketwire - Nov 13, 2012) -

WHO: 
OneSpin Solutions™ (www.onespin-solutions.com), provider of innovative formal assertion-based verification solutions for integrated circuit (IC) and field programmable gate array (FPGA) system-on-chip (SoC) designs, and IMEC (www.imec.be)

WHAT: 
Will host a free hands-on tutorial titled, "Metric-Driven Formal Verification with 360 MV." Attendees will learn the fundamentals of OneSpin 360™ MV, a formal assertion-based verification (ABV) tool to comprehensively analyze and track register transfer level (RTL) code and assertions throughout the design space.

WHEN:
Thursday, November 15, 2012 from 9 a.m. until 5 p.m.

WHERE:
IMEC, Leuven, Belgium

The tutorial is free for qualified engineering and verification managers and digital design and verification engineers. To register, send email to: training@imec.be.

For more information about OneSpin Solutions, visit: www.onespin-solutions.com.

The IMEC (Interuniversity Microelectronics Centre) website can be found at: www.imec.be.

About OneSpin Solutions
Electronic design automation (EDA) supplier OneSpin Solutions of Munich, Germany, was founded in 2005 as a spin-off from Infineon Technologies AG. It leverages more than 300 engineer-years of formal verification technology development and application service experience to enable design teams to avoid costly redesigns and respins, while dramatically cutting their verification effort and costs and time-to-market pressures. Market-leading telecommunications, automotive, consumer electronics, and embedded systems companies rely on OneSpin to reduce their verification effort and achieve the industry's highest possible verification quality. Email: info@onespin-solutions.com. Website: www.onespin-solutions.com.

OneSpin, OneSpin Solutions and the OneSpin logo are trademarks of OneSpin Solutions GmbH. All other trademarks are the property of their respective owners.