SOURCE: octoScope


August 02, 2011 12:00 ET

REMINDER: octoScope Demonstrates New Smartphone Test Platform and President Fanny Mlinarsky Speaks on OTA Test Methods and Metrics at NIWeek

AUSTIN, TX--(Marketwire - Aug 2, 2011) -

octoScope, Inc., a RF and wireless company, will attend NIWeek, National Instruments 17th annual technology conference, and demonstrate a new platform for smartphone testing in National Instruments RF Pavilion. octoScope president Fanny Mlinarsky will also speak on Over-The-Air (OTA) test methods and metrics.

Tuesday-Thursday, August 2 to 4, 2011
National Instruments RF Pavilion

TS5101 Over-the-Air Test Methods and Metrics Technical Session
10:30-11:30 a.m. Wednesday, August 3, 2011
Modern smart phones with cellular, 3G/4G, Wi-Fi, Bluetooth and GPS radios cry out for OTA test methods due to their sheer number of connections. This session will review OTA test methods and metrics being developed for 3GPP and CTIA and discuss practical approaches to fast and accurate OTA-based production testing.

Austin Convention Center
Austin, TX

For More Information
For more information about octoScope or to schedule an appointment and demonstration, please visit or contact
Please visit to register for NIWeek.

About octoScope
octoScope offers RF and wireless technology products and consulting services.
For more information, please visit

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