SOURCE: Teseda Corporation

Teseda Corporation

February 19, 2015 05:30 ET

Soft Machines Inc. Purchases Diagnostic Test System From Teseda Corporation

Teseda Corporation's Diagnostic Test System for First Silicon Bring-Up Validated by Soft Machines Inc.; Silicon Valley-Based Semiconductor Startup Company, Soft Machines Inc., Selects Teseda's Diagnostic Test System for First Silicon Bring-Up, Diagnosis and Optimization

PORTLAND, OR--(Marketwired - February 19, 2015) - Teseda Corporation today announced receipt of an order for the Teseda Diagnostic Test System from Soft Machines, Inc.

Soft Machines, a licenser and co-developer of VISC™ architecture-based microprocessor and SoC products for loT, mobile and cloud markets, has purchased the Teseda Diagnostic Test System for bench-top stimulus, test pattern debug, validation, and device failure mode stimulation.

The Diagnostic Test System is a core design analysis tool used for first silicon bring-up that has provided Soft Machines with a complete bench-top device stimulus and test system to achieve working silicon and prove the invention of VISC™ Microprocessor Architecture.

"Soft Machine's VISC architecture revives CPU performance-per-watt scaling by incorporating the new concept of virtual cores and virtual threads," stated Mohammad Abdallah, Co-Founder, President and Chief Technology Officer for Soft Machines. "The Teseda Diagnostic Test System helped us to quickly bring-up test patterns and validate functionality of the silicon which featured a break-through new architecture."

"We were delighted with Soft Machines' selection of our Diagnostic Test System as their platform of choice. By using this system they achieved remarkable results with their 'bleeding edge' first silicon," said Armagan Akar, Chief Executive Officer at Teseda Corporation. "Soft Machines' experience is another strong validation of our well-thought-out DFT methodology, resulting in major cost and time savings by this purpose-built bench-top diagnostic silicon verification system."

The bring-up time spent after first silicon arrival continues to increase with design size, complexity and geometry shrinkage as does the difficulty and effort required to debug silicon errors. The Teseda Diagnostic Test System provides the means for accessibility of internal scan architectures to specifically exploit the benefits of scan for first silicon bring-up and also eliminates the need for expensive ATE at this stage of the development.

System users experience rapid verification of silicon functionality, achieving silicon debug in days versus months resulting in low cost silicon characterization and validation.

Design and product engineers implement, test and verify device software modifications to maximize performance in a desktop or bench-top work environment, and to allow remote access to the tool set from anywhere in the world.

The system was first installed in Q2, 2014 under a rent-to-own scenario and later converted to purchase based on the success and value demonstrated during first silicon bring-up. For more information about Teseda's Diagnostic Test System, please visit http://www.teseda.com/#!/products.

About Soft Machines Inc.

Soft Machines is a 250-person late-stage semiconductor startup with operations in the U.S., India and Russia. The company is in the business of licensing and co-developing VISC-architecture-based Core and SoC products for IoT, mobile and cloud markets. Corporate headquarters are in Santa Clara, California, USA. For more information, go to www.softmachines.com.

About Teseda Corporation

Teseda Corporation, based in Portland, Oregon, was founded in 2001. What makes Teseda's solutions so unique is the combination of bench-top test hardware with powerful software tools to produce systems that are capable of performing device analysis in ways that no other semiconductor equipment provider can, or does. From a portable, go anywhere system for Remote Customer Quality Engineers to quickly screen potential field returns, to a small and powerful Design and Product Engineering system for first silicon bring-up, to a fully equipped device analysis lab system for detailed physical root cause defect isolation, Teseda provides unique and critical technology for semiconductor device analysis. More information can be found at: www.teseda.com.

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Contact Information

  • For more information contact:

    Joan Frazer
    Media Contact
    Teseda Corporation
    +1 503.223.3315
    Joan_frazer@teseda.com