Verigy V93000 HSM3G Solution Honored With Test Product of the Year Award and Named Best in Test

CUPERTINO, CA--(Marketwire - May 19, 2011) - Verigy Ltd. (NASDAQ: VRGY), a premier semiconductor test company, has won three Test & Measurement World Best in Test 2011 awards, which recognize important and innovative new products in the test and measurement industry. The Verigy V93000 HSM3G Production Test System was honored as Test Product of the Year and won Best in Test in the Semiconductor Test category, while the Verigy V93000 Direct-Probe Solution won Best in Test in the Wafer Probing category. Winners are chosen by Test & Measurement World readers and editors.

"For the 2011 Best in Test awards, we reviewed numerous commendable products to select 72 finalists across 16 competitive product categories," said Rick Nelson, editorial director, Test & Measurement World. "Verigy's V93000 HSM3G was the top vote getter overall and exemplifies what a commitment to innovation can achieve."

The Verigy V93000 HSM3G is designed to test low-cost volume production of DDR3, DDR4 and beyond. The V93000 HSM3G delivers highly accurate at-speed testing and is scalable to 2.9Gbps. A multi-generation growth path via economical upgrades up to 6.8Gbps data rate provides a unique lifetime value and outstanding return of investment.

The V93000 Direct-Probe™ solution significantly improves signal path and the mechanical infrastructure between the tester and the probe card bringing the industry's highest test performance to wireless, wafer-level chip scale package, MPU and GPU devices at wafer probe.

"Our innovation is inspired by helping our customers to achieve their productivity, time-to-market and cost of test goals," said Jorge Titinger, president and chief executive officer, Verigy. "This Best in Test recognition reinforces our commitment to continually address the next generation of testing needs. Thank you to the readers and editors of Test & Measurement World for this honor."

About the Best in Test Awards
Inaugurated in 1991, the Test & Measurement World Best in Test awards program honors excellence and innovation in test, measurement, and inspection products. To be eligible for the 2011 Best in Test awards, a product or service must have been introduced between November 1, 2009, and October 31, 2010.

About Verigy
Verigy provides advanced semiconductor test systems and solutions used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Verigy offers scalable platforms for a wide range of system-on-chip (SOC) test solutions, and memory test solutions for Flash, DRAM including high-speed memories, as well as multi-chip packages (MCP). Verigy also provides advanced analysis tools that accelerate design debug and yield ramp processes. Additional information about Verigy can be found at www.verigy.com.